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1. Identificação
Tipo de ReferênciaArtigo em Revista Científica (Journal Article)
Sitemtc-m16.sid.inpe.br
Código do Detentorisadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S
Identificador6qtX3pFwXQZsFDuKxG/FaMLd
Repositóriosid.inpe.br/marciana/2005/02.14.14.13   (acesso restrito)
Última Atualização2005:02.14.02.00.00 (UTC) administrator
Repositório de Metadadossid.inpe.br/marciana/2005/02.14.14.13.52
Última Atualização dos Metadados2018:06.05.01.28.49 (UTC) administrator
Chave SecundáriaINPE-12165-PRE/7505
ISSN0038-1101
Chave de CitaçãoVeissidBonnRich:1995:CoInUn
TítuloExperimental investigation of the double exponential model of a solar cell under illuminated conditions: Considering the instrumental uncertainties in the current, voltage and temperature values
ProjetoCELSOL: Células solares
Ano1995
MêsNov.
Data de Acesso18 maio 2024
Tipo SecundárioPRE PI
Número de Arquivos1
Tamanho693 KiB
2. Contextualização
Autor1 Veissid, N.
2 Bonnet, D
3 Richter, H
Grupo1 LAS-INPE-MCT-BR
Afiliação1 Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais (INPE.LAS)
2 ANTEC GmbH
3 ANTEC GmbH
RevistaSolid State Electronics
Volume38
Número11
Páginas1937-1943
Histórico (UTC)2005-02-14 16:13:53 :: sergio -> administrator ::
2007-04-04 23:56:49 :: administrator -> sergio ::
2008-01-07 12:50:04 :: sergio -> marciana ::
2008-02-21 16:16:52 :: marciana -> administrator ::
2018-06-05 01:28:49 :: administrator -> marciana :: 1995
3. Conteúdo e estrutura
É a matriz ou uma cópia?é a matriz
Estágio do Conteúdoconcluido
Transferível1
Tipo do ConteúdoExternal Contribution
Palavras-ChaveMATERIALS PHYSICS
Solar cell
Standard deviation
FÍSICA DE MATERIAIS
Células solares
Desvio padrão
ResumoIn this paper is presented a new approach for determining the current standard deviation which is used in the current-voltage characteristic fitting. The analytical equation has been deduced from propagation of errors theory and it takes into account measurement uncertainties in the current, voltage and temperature values. A conventional monocrystalline silicon solar cell sample has been used to test the theory. We measured several I-V curves under illuminated condition with the temperature varying in the range between −75 and 75°C. We have adopted the chi-square minimization as the error criterion for fitting the experimental curves using the standard deviation proposed in this work. The main advantage of the proposed formalism is that it leads to an improved chi-square value, i.e value physically and statistically more acceptable. We obtain best values for the standard deviation of the parameters from a fitting procedure using the double exponential model. The results show that for a measurement uncertainty of 0.5°C in the temperature, the uncertainty in the current around the open circuit is of about 5% of the short circuit current. Consequently, we conclude that a carefully controlled temperature during measurement is an essential condition for obtaining reliable experimental I-V curves. Tables and figures show the fitted double exponential parameters fitted as a function of temperature, as well as their standard deviations.
ÁreaFISMAT
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Conteúdo da Pasta docacessar
Conteúdo da Pasta sourcenão têm arquivos
Conteúdo da Pasta agreementnão têm arquivos
4. Condições de acesso e uso
Idiomaen
Arquivo Alvoexperimental veissid.pdf
Grupo de Usuáriosadministrator
marciana
sergio
Visibilidadeshown
Detentor da CópiaSID/SCD
Política de Arquivamentodenypublisher denyfinaldraft24
Permissão de Leituradeny from all and allow from 150.163
5. Fontes relacionadas
Unidades Imediatamente Superiores8JMKD3MGPCW/3ESR3H2
DivulgaçãoWEBSCI; PORTALCAPES.
Acervo Hospedeirosid.inpe.br/banon/2003/08.15.17.40
6. Notas
Campos Vaziosalternatejournal archivist callnumber copyright creatorhistory descriptionlevel documentstage doi e-mailaddress electronicmailaddress format isbn label lineage mark mirrorrepository nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress readergroup resumeid rightsholder schedulinginformation secondarydate secondarymark session shorttitle sponsor subject tertiarymark tertiarytype typeofwork url versiontype
7. Controle da descrição
e-Mail (login)marciana
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